Terahertz detection using Si-SiGe MODFETs

We report on resonant and non-resonant (broad-band) detection of terahertz (THz) radiation using Strained-Si MODFETs. The devices were excited at room temperature by two types of THz sources at 0.292 THz and at 1.5 THz. Non-resonant response with maxima around the threshold voltage was observed. Shubnikov-de Haas along with photoresponse measurements were performed simultaneously to demonstrate that the observed response is related to the plasma waves oscillation in the channel. The device was cooled down to 4.2 K and resonant signature could be observed.

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Source Electron Devices (CDE), 2013 Spanish Conference on
Author Meziani, Y.M, Velazquez-Perez, J.E, Coquillat, Dominique, Diakonova, Nina, Knap, Wojciech, Grigelionis, I, Garcia-Garcia, E, Fobelets, K
Maintainer CCSD
Last Updated May 11, 2026, 08:39 (UTC)
Created May 11, 2026, 08:39 (UTC)
Identifier hal-00816915
Language en
contributor Laboratoire Charles Coulomb (L2C) ; Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)
coverage Valladolid, Spain
creator Meziani, Y.M
date 2013-02-12T00:00:00
harvest_object_id 9cffa2e8-4c07-4dc2-81ad-1bc16f9d13b0
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-01-13T00:00:00
relation info:eu-repo/semantics/altIdentifier/doi/10.1109/CDE.2013.6481369
set_spec type:COMM