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In Flight SEU/MCU Sensitivity of Commercial Nanometric SRAMs: Operational Est...
International audience -
Towards Low-cost Soft Error Mitigation in SRAM-based FPGAs: a Case Study on A...
ISBN 978-1-4673-1206-6 -
Influence of beam conditions and energy for SEE testing
International audience -
Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes
International audience -
Soft Error Triggering Criterion Based on Simplified Electrical Model of the S...
International audience -
Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress
International audience -
Failure Analysis and Test Solutions for Low-Power SRAMs
International audience -
Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-...
International audience -
A Novel Framework for Evaluating the SRAM Core-Cell Sensitivity to Neutrons
International audience -
Characteristics of the Transient Currents Induced by Atmospheric Neutrons on ...
International audience -
Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM A...
International audience -
On Using Address Scrambling for Defect Tolerance in SRAMs
International audience -
Temperature Impact on the Neutron SER of a Commercial 90nm SRAM
International audience -
Dynamic-Stress Neutrons Test of Commercial SRAMs
International audience -
A Built-in Scheme for Testing and Repairing Voltage Regulators of Low-Power S...
International audience -
Defect Analysis in Power Mode Control Logic of Low-Power SRAMs
International audience -
Dynamic Mode Testing of SRAMS under Neutron Radiation
National audience -
Characterization of an SRAM Based Particle Detector For Mixed-Field Radiation...
International audience -
Dynamically Configurable Security for SRAM FPGA Bitstreams
FPGAs are becoming increasingly attractive – thanks to the improvement of their capacities and their performances. Today, FPGAs represent an efficient design solution...
