Failure Analysis and Test Solutions for Low-Power SRAMs
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | 20th IEEE Asian Test Symposium |
| Author | Zordan, Leonardo B., Bosio, Alberto, Dilillo, Luigi, Girard, Patrick, Pravossoudovitch, Serge, Todri-Sanial, Aida, Virazel, Arnaud, Badereddine, Nabil |
| Maintainer | CCSD |
| Last Updated | May 12, 2026, 02:26 (UTC) |
| Created | May 12, 2026, 02:26 (UTC) |
| Identifier | lirmm-00805123 |
| Language | en |
| contributor | Conception et Test de Systèmes MICroélectroniques (SysMIC) ; Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM) ; Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | New Delhi, India |
| creator | Zordan, Leonardo B. |
| date | 2011-11-20T00:00:00 |
| harvest_object_id | 85b46d5b-7723-48fb-9a72-1d93ad3b28c5 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2023-03-24T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/ATS.2011.97 |
| set_spec | type:COMM |