Soft Error Triggering Criterion Based on Simplified Electrical Model of the SRAM cell
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0018-9499 |
| Author | Wrobel, Frédéric, Touboul, Antoine, Dilillo, Luigi, Saigné, Frédéric |
| Maintainer | CCSD |
| Last Updated | May 12, 2026, 02:42 (UTC) |
| Created | May 12, 2026, 02:42 (UTC) |
| Identifier | lirmm-00805001 |
| Language | en |
| contributor | Radiations et composants (RADIAC) ; Institut d’Electronique et des Systèmes (IES) ; Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Wrobel, Frédéric |
| date | 2013-01-30T00:00:00 |
| harvest_object_id | 2b4e9941-6d7d-4aed-8dc2-1cbfb50983b0 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-02-20T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2012.2235148 |
| set_spec | type:ART |