In Flight SEU/MCU Sensitivity of Commercial Nanometric SRAMs: Operational Estimations
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0018-9499 |
| Author | Artola, L., Velazco, Raoul, Hubert, G., Duzellier, S., Nuns, T., Guerard, B., Peronnard, P., Mansour, W., Pancher, Fabrice, Bezerra, F. |
| Maintainer | CCSD |
| Last Updated | May 27, 2026, 18:19 (UTC) |
| Created | May 27, 2026, 18:19 (UTC) |
| Identifier | hal-00672424 |
| Language | en |
| contributor | ONERA - The French Aerospace Lab [Toulouse] ; ONERA |
| creator | Artola, L. |
| date | 2011-05-27T00:00:00 |
| harvest_object_id | 0aaf4005-5a22-4655-bdbf-b276ff73f963 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-26T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2011.2172220 |
| set_spec | type:ART |