Dataset - CKAN

Eliminating speed penalty in ECC protected memories

ISBN 978-1-61284-208-0
- HTML
Effect of Au and Ni layer thicknesses on the reliability of BGA solder joints

ISBN: 1-4244-0107-0
- HTML
Test algorithms for ECC-based memory repair in nanotechnologies

ISBN 978-1-4673-1073-4
- HTML
Back-End Dielectrics Reliability under Unipolar and Bipolar AC-Stress

International audience
- HTML
Through-Silicon-Via Built-In Self-Repair for Aggressive 3D Integration

ISBN 978-1-4673-2084-9
- HTML

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