Test algorithms for ECC-based memory repair in nanotechnologies
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Proc.of IEEE VLSI Test Symposium (VTS) |
| Author | Papavramidou, P., Nicolaidis, M. |
| Maintainer | CCSD |
| Last Updated | May 11, 2026, 09:34 (UTC) |
| Created | May 11, 2026, 09:34 (UTC) |
| Identifier | hal-00815986 |
| Language | en |
| contributor | Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Maui, Hawaii, United States |
| creator | Papavramidou, P. |
| date | 2012-04-23T00:00:00 |
| harvest_object_id | 37287d06-a842-47e7-a118-a9be697419b2 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-26T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/VTS.2012.6231058 |
| set_spec | type:COMM |