Back-End Dielectrics Reliability under Unipolar and Bipolar AC-Stress
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | IEEE International Reliability Physics |
| Author | Chery, E., Federspiel, X., Beylier, G., Besset, C., Roy, David, Volpi, F., Chaix, J.M. |
| Maintainer | CCSD |
| Last Updated | May 11, 2026, 02:00 (UTC) |
| Created | May 11, 2026, 02:00 (UTC) |
| Identifier | hal-00824376 |
| Language | en |
| contributor | STMicroelectronics [Crolles] (ST-CROLLES) |
| creator | Chery, E. |
| date | 2012-05-11T00:00:00 |
| harvest_object_id | 7feac960-0d41-42b0-9791-b7b2137e18ad |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-09-27T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/IRPS.2012.6241804 |
| set_spec | type:ART |