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Crack propagation modeling on the interfaces of thermal barrier coating syste...
International audience -
Reduced Dependent Ordered Binary Decision Diagrams: An Extension of ROBDDs fo...
In this report, we presented an extension of robdds that is able to accommodate certain dependencies among their (Boolean) variables. In particular, this extension... -
A built-in I/sub IDDQ/ testing circuit
ISBN: 0-7803-9205-1 -
Failure Analysis and Test Solutions for Low-Power SRAMs
International audience -
Low-power SRAMs Power Mode Control Logic: Failure Analysis and Test Solutions
International audience -
Defect Analysis in Power Mode Control Logic of Low-Power SRAMs
International audience -
Resistive-Open Defect Analysis for Through-Silicon-Vias
International audience -
Fault Localization Improvement through an Intra-Cell Diagnosis Approach
International audience -
Test algorithms for ECC-based memory repair in nanotechnologies
ISBN 978-1-4673-1073-4 -
New statistical post processing approach for precise fault and defect localiz...
International audience -
Fault modeling and diagnosis for nanometric analog circuits
International audience -
Fault-tolerant adaptive routing under permanent and temporary failures for ma...
International audience -
Finite elements for modeling of localized failure in reinforced concrete
In this work, several beam finite element formulations are proposed for failure analysis of planar reinforced concrete beams and frames under monotonic static loading....
