New statistical post processing approach for precise fault and defect localization in TRI database acquired on complex VLSI
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2013) |
| Author | Chef, Samuel, Perdu, Philippe, Bascoul, Guillaume, Jacquir, Sabir, Sanchez, Kevin, Binczak, Stéphane |
| Maintainer | CCSD |
| Last Updated | May 9, 2026, 18:58 (UTC) |
| Created | May 9, 2026, 18:58 (UTC) |
| Identifier | hal-00860841 |
| Language | en |
| contributor | Laboratoire Electronique, Informatique et Image [UMR6306] (Le2i) ; Université de Bourgogne (UB)-École Nationale Supérieure d'Arts et Métiers (ENSAM)-AgroSup Dijon - Institut National Supérieur des Sciences Agronomiques, de l'Alimentation et de l'Environnement-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Suzhou, China |
| creator | Chef, Samuel |
| date | 2013-07-15T00:00:00 |
| harvest_object_id | b70b353b-5568-4c87-8083-a43b54bf5a64 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-08-12T00:00:00 |
| set_spec | type:COMM |