A built-in I/sub IDDQ/ testing circuit
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Solid-State Circuits Conference, 2005. ESSCIRC 2005. Proceedings of the 31st European |
| Author | Matakias, S., Tsiatouhas, Y., Arapoyanni, A., Haniotakis, Th., Prenat, Guillaune, Mir, Salvador |
| Maintainer | CCSD |
| Last Updated | May 13, 2026, 10:25 (UTC) |
| Created | May 13, 2026, 10:25 (UTC) |
| Identifier | hal-00079771 |
| Language | en |
| contributor | Department of Informatics [Athens] (CS-AUEB) ; Mobile Multimedia Laboratory [Athens] ; Athens University of Economics and Business (AUEB)-Athens University of Economics and Business (AUEB) |
| coverage | Grenoble, France |
| creator | Matakias, S. |
| date | 2005-05-13T00:00:00 |
| harvest_object_id | c3a5c4ee-e4ed-42c9-924f-c86e283cd10b |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-26T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/ESSCIR.2005.1541662 |
| set_spec | type:COMM |