Built-In Self-Test for Manufacturing TSV Defects before bonding
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | 32nd VLSI Test Symposium |
| Author | Di Natale, Giorgio, Flottes, Marie-Lise, Rouzeyre, Bruno, Zimouche, Hakim |
| Maintainer | CCSD |
| Last Updated | May 5, 2026, 11:33 (UTC) |
| Created | May 5, 2026, 11:33 (UTC) |
| Identifier | lirmm-00989682 |
| Language | en |
| contributor | Conception et Test de Systèmes MICroélectroniques (SysMIC) ; Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM) ; Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Napa, CA, United States |
| creator | Di Natale, Giorgio |
| date | 2014-04-13T00:00:00 |
| harvest_object_id | 24611493-9e31-43fa-9865-630d1d1ceed5 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2023-03-24T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/VTS.2014.6818771 |
| set_spec | type:COMM |