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Soft Error Triggering Criterion Based on Simplified Electrical Model of the S...
International audience -
Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress
International audience -
Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-...
International audience -
A Novel Framework for Evaluating the SRAM Core-Cell Sensitivity to Neutrons
International audience -
Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM A...
International audience
