Temperature, Back Gate and Polarization Studies in Nanotransistor based THz plasma detectors

Nanometer size field effect transistors can operate as efficient resonant or broadband terahertz detectors, mixers, phase shifters and frequency multipliers at frequencies far beyond their fundamental cut-of frequency. This work is an overview of some recent results concerning the THz detection by Si MOS transistors with back-gate, low temperatures operation, and circular polarization studies of nanometer scale field effect transistors for the detection of terahertz radiation. Also first results on graphene transistors are discussed.

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Source 21st International Conference on Applied Electromagnetics and Communications ICECom
Author Knap, Wojciech, But, Dmytro, Bawedin, M., Chang, S., Klimenko, Oleg, Diakonova, Nina, Coquillat, Dominique, El Fatimy, Abdel, Teppe, Frederic, Gutin, A., Nagatsuma, T., Cristoloveanu, S.
Maintainer CCSD
Last Updated May 6, 2026, 03:31 (UTC)
Created May 6, 2026, 03:31 (UTC)
Identifier hal-00955621
Language en
contributor Laboratoire Charles Coulomb (L2C) ; Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)
coverage Dubrovnik, Croatia
creator Knap, Wojciech
date 2013-10-14T00:00:00
harvest_object_id 227c40ee-f821-447d-9857-a60795d1714b
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-02-07T00:00:00
relation info:eu-repo/semantics/altIdentifier/doi/10.1109/ICECom.2013.6684747
set_spec type:COMM