Pseudorandom Functional BIST for Linear and Nonlinear MEMS

ISBN: 3-9810801-1-4

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Source Design, Automation and Test in Europe, 2006. DATE '06. Proceedings
Author Dhayni, A., Mir, Salvador, Rufer, Libor, Bounceur, Ahcène
Maintainer CCSD
Last Updated May 7, 2026, 17:51 (UTC)
Created May 7, 2026, 17:51 (UTC)
Identifier hal-00092107
Language en
contributor Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)
coverage Munich, Germany
creator Dhayni, A.
date 2006-05-07T00:00:00
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harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-03-26T00:00:00
set_spec type:COMM