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Transport properties and low-frequency noise in low-dimensional structures
Electrical and physical properties of low-dimensional structures have been studied for the various applications such as electronics, sensors, and etc. Low-frequency... -
Theoretical and experimental study of non-thermal, plasma-assisted gasoline r...
Thèse confidentielle jusqu'au 28 juin 2011, levée de la confidentialité mars 2012. -
Development of a single-chamber solid oxide fuel cell working under methane/o...
This study is devoted to the development of a single-chamber solid oxide fuel cell. Contrary to a conventional solid oxide fuel cell, a single chamber fuel cell works... -
Study at nanoscale, using scanning probe microscopy, of thin dielectric fiali...
In order to continue the scaling of the MOS transistor the replacement of the gate oxide layer by a high K/Metal gate was mandatory. From a reliability point of view,... -
True 3D Packaging Solution for Stacked Vertical Power Devices
International audience -
Electrical characterization and reliability of FDSOI transistors with High-k ...
The integration of High-k dielectrics in transistors gate stacks lead to new complex reliability issues. Furthermore new problematics appear with the use of fully... -
ANALYTICAL MODELS AND ELECTRICAL CHARACTERISATION OF ADVANCED MOSFETS IN THE ...
International audience -
Electrical properties and modeling of Advanced MOS devices : FD-SOI Tri-gate ...
Novel advanced metal-oxide semiconductor (MOS) devices such as fully-depleted-silicon-on-insulator (FD-SOI) Tri-gate transistor, junctionless transistor, and... -
Electrical characterization of semiconductor nanowires by scanning tunneling ...
In order to understand the structural and electronic properties of semiconductor nanowires, scanning tunneling microscopy is an appealing technique that can supplement...
