The thesis focuses on the study of the reliability of assemblies using Pb-free alloys under' harsh environment for electronic applications. A method for preparing metallographic reliable and reproducible for the microstructural analysis is presented. The effect of thermal aging on the static microstructural evolution of solder balls in SAC, the resistance to mechanical fatigue of solder joints and the study of thermomechanical damage are developed. The only significant effect observed after thermal aging is the increase in thickness of the intermetallic contact. Following mechanical, ruptures are most often seen in the copper tracks of the assembly, and do not blame the solder microstructure elements as determinants of crack propagation. The thermomechanical stresses lead to recrystallization, and then cracks propagate along the grain boundaries of recrystallized.
