Self-test and self-calibration of a MEMS convective accelerometer
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2013 on, Barcelona, 2013, pp. 1-4.keywords: {accelerometers;calibration;integrated circuit design;integrated circuit measurement;integrated circuit testing;microsensors;MEMS convective accelerometer;electrical-only test parameter;integrate on-chip circuitry;self-calibration procedure;self-testing;Accelerometers;Bridge circuits;Calibration;Heating;Micromechanical devices;Resistance;Sensitivity;Convective Accelerometer;Design for Test;MEMS}, |
| Author | Rekik, Ahmed, Azaïs, Florence, Mailly, Frédérick, Nouet, Pascal, Masmoudi, Mohamed |
| Maintainer | CCSD |
| Last Updated | May 11, 2026, 11:10 (UTC) |
| Created | May 11, 2026, 11:10 (UTC) |
| Identifier | lirmm-00814231 |
| Language | en |
| contributor | Département de Génie Électrique de Sfax [ENIS] (CEM Lab - ENIS) ; المدرسة الوطنية للمهندسين بصفاقس = National Engineering School of Sfax (ENIS) ; جامعة صفاقس - Université de Sfax - University of Sfax-جامعة صفاقس - Université de Sfax - University of Sfax |
| coverage | Barcelona, Spain |
| creator | Rekik, Ahmed |
| date | 2013-04-16T00:00:00 |
| harvest_object_id | 3a80bb9c-688d-4ece-a87e-8a1933172829 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-05-28T00:00:00 |
| set_spec | type:COMM |