Vacancy defect and carrier distributions in the high mobility electron gas formed at ion-irradiated SrTiO(3) surfaces

Using a combination of advanced characterization tools (positron annihilation spectroscopy, conductive-tip atomic force microscopy, and high-field magnetotransport), we have studied the extension, origin and properties of the high mobility electron gas (HMEG) generated by etching the SrTiO(3) surfaces with Ar(+) ions. Contrary to previous assumptions, we show that this HMEG is not confined to nanometric thickness but extends to a few micrometer from the surface. We discuss this unanticipated large spatial extension in terms of the striking large diffusion of oxygen vacancy-related defects. (C) 2010 American Institute of Physics.

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Source ISSN: 0021-8979
Author Herranz, G., Copie, O., Gentils, A., Tafra, E., Basletic, M., Fortuna, F., Bouzehouane, K., Fusil, S., Jacquet, E., Carretero, C., Bibes, M., Hamzic, A., Barthelemy, A.
Maintainer CCSD
Last Updated May 28, 2026, 17:03 (UTC)
Created May 28, 2026, 17:03 (UTC)
Identifier in2p3-00670129
Language en
contributor Institut de Ciencia de materials de barcelone
creator Herranz, G.
date 2010-05-28T00:00:00
harvest_object_id bc01aa6a-4fc4-4473-b390-91190c6ae8f8
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-04-08T00:00:00
relation info:eu-repo/semantics/altIdentifier/doi/10.1063/1.3369438
set_spec type:ART