BIST for Logic and Local Interconnect Resources in a Novel Mesh of Cluster FPGA
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) |
| Author | Rehman, Saif-Ur, Benabdenbi, Mounir, Anghel, Lorena |
| Maintainer | CCSD |
| Last Updated | May 5, 2026, 13:23 (UTC) |
| Created | May 5, 2026, 13:23 (UTC) |
| Identifier | hal-00982772 |
| Language | en |
| contributor | Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | New-York, United States |
| creator | Rehman, Saif-Ur |
| date | 2013-10-02T00:00:00 |
| harvest_object_id | 6da107ff-b13c-4c6c-9a22-809577ad5ce8 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-26T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/DFT.2013.6653622 |
| set_spec | type:COMM |