Defect-Oriented Non-Intrusive RF Test Using On-Chip Temperature Sensors
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | IEEE VLSI Test Symposium (VTS'13) |
| Author | Abdallah, L., Stratigopoulos, Haralampos-G, Mir, Salvador, Altet, J. |
| Maintainer | CCSD |
| Last Updated | May 5, 2026, 15:47 (UTC) |
| Created | May 5, 2026, 15:47 (UTC) |
| Identifier | hal-00975942 |
| Language | en |
| contributor | Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Berkeley, CA, United States |
| creator | Abdallah, L. |
| date | 2013-04-29T00:00:00 |
| harvest_object_id | 4931f3ef-43df-40ed-970c-1830a4326e35 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-26T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/VTS.2013.6548889 |
| set_spec | type:COMM |