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Smart selection of indirect parameters for DC-based alternate RF IC testing
International audience -
A 0-level packaged RF-MEMS switched wideband GaAs LNA MMIC
This paper focuses on the design of an RF-MEMS Dicke switched wideband LNA realized in a GaAs MMIC process that also includes a BCB cap type of wafer-level package.... -
Defect-Oriented Non-Intrusive RF Test Using On-Chip Temperature Sensors
ISBN : 978-1-4673-5542-1
