Defect analysis and excitons diffusion in undoped homoepitaxial diamond films after polishing and oxygen plasma etching
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0925-9635 |
| Author | Volpe, Pierre-Nicolas, Muret, Pierre, Omnès, Franck, Achard, Jocelyn, Silva, François, Brinza, Ovidiu, Gicquel, Alix |
| Maintainer | CCSD |
| Last Updated | May 5, 2026, 19:58 (UTC) |
| Created | May 5, 2026, 19:58 (UTC) |
| Identifier | hal-00967297 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Semi-conducteurs à large bande interdite (NEEL - SC2G) ; Institut Néel (NEEL) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Volpe, Pierre-Nicolas |
| date | 2009-05-03T00:00:00 |
| harvest_object_id | 47176518-d612-44c9-9508-6cdb8e9b3246 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-09-27T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1016/j.diamond.2009.04.008 |
| set_spec | type:ART |