Cathodoluminescence of stacking fault bound excitons for local probing of the exciton diffusion length in single GaN nanowires
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0003-6951 |
| Author | Nogues, Gilles, Auzelle, Thomas, den Hertog, Martien, Gayral, Bruno, Daudin, Bruno |
| Maintainer | CCSD |
| Last Updated | May 6, 2026, 01:51 (UTC) |
| Created | May 6, 2026, 01:51 (UTC) |
| Identifier | hal-00958223 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Nanophysique et Semiconducteurs (NEEL - NPSC) ; Institut Néel (NEEL) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Nogues, Gilles |
| date | 2014-03-11T00:00:00 |
| harvest_object_id | 608effaf-2fe7-4825-bd8f-99309ae8f990 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-12-15T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/arxiv/1403.3886 |
| set_spec | type:ART |