Ultralong and Defect-Free GaN Nanowires Grown by the HVPE Process
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 1530-6984 |
| Author | Avit, G., Lekhal, Kaddour, André, Y., Bougerol, Catherine, Reveret, François, Leymarie, Joël, Gil, E., Monier, Guillaume, Castelluci, D., Trassoudaine, Agnès |
| Maintainer | CCSD |
| Last Updated | May 6, 2026, 15:16 (UTC) |
| Created | May 6, 2026, 15:16 (UTC) |
| Identifier | hal-00945828 |
| Language | en |
| contributor | Institut Pascal (IP) ; Université Blaise Pascal - Clermont-Ferrand 2 (UBP)-SIGMA Clermont (SIGMA Clermont)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Avit, G. |
| date | 2014-01-06T00:00:00 |
| harvest_object_id | f28cf12b-d1dd-412a-b7ba-adb8d345663e |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-09-27T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1021/nl403687h |
| set_spec | type:ART |