Redundancy Method to assess Electromigration Lifetime in power grid design
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | IEEE International Interconnect Technology Conference (IITC), |
| Author | Ouattara, Boukary, Doyen, Lise, Ney, David, Mehrez, Habib, Bazargan-Sabet, Pirouz, Bana, Franck Lionel |
| Maintainer | CCSD |
| Last Updated | May 7, 2026, 21:38 (UTC) |
| Created | May 7, 2026, 21:38 (UTC) |
| Identifier | hal-00915971 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Circuits Intégrés Numériques et Analogiques (CIAN) ; Laboratoire d'Informatique de Paris 6 (LIP6) ; Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Kyoto, Japan |
| creator | Ouattara, Boukary |
| date | 2013-06-13T00:00:00 |
| harvest_object_id | 1772ac02-bcb3-4202-ad16-9fce3f6bbcbe |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2023-04-11T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/IITC.2013.6615570 |
| set_spec | type:COMM |