P-type and N-type multi-gate polycrystalline silicon vertical thin film transistors based on low-temperature technology
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0038-1101 |
| Author | Zhang, Peng, Jacques, Emmanuel, Rogel, Regis, Bonnaud, Olivier |
| Maintainer | CCSD |
| Last Updated | May 8, 2026, 04:51 (UTC) |
| Created | May 8, 2026, 04:51 (UTC) |
| Identifier | hal-00906019 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Institut d'Électronique et des Technologies du numéRique (IETR) ; Université de Nantes (UN)-Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes) ; Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS) |
| creator | Zhang, Peng |
| date | 2013-05-08T00:00:00 |
| harvest_object_id | e8b0b5ef-e186-4e48-80eb-f3c73e9cdd64 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2023-03-24T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sse.2013.04.021 |
| set_spec | type:ART |