Thermoelectric and micro-Raman measurements of carrier density and mobility in heavily Si-doped GaN wires
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0003-6951 |
| Author | Tchoulfian, Pierre, Donatini, Fabrice, Levy, François, Amstatt, Benoît, Dussaigne, Amélie, Ferret, Pierre, Bustarret, Etienne, Pernot, Julien |
| Maintainer | CCSD |
| Last Updated | May 8, 2026, 05:11 (UTC) |
| Created | May 8, 2026, 05:11 (UTC) |
| Identifier | hal-00905599 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Semi-conducteurs à large bande interdite (NEEL - SC2G) ; Institut Néel (NEEL) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Tchoulfian, Pierre |
| date | 2013-11-11T00:00:00 |
| harvest_object_id | 006e2f89-ebfe-459a-983e-7653577db16a |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-09-27T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1063/1.4829857 |
| set_spec | type:ART |