LMS-Based RF BIST Architecture for Multistandard Transmitters
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) |
| Author | Dogaru, Emanuel, Vinci dos Santos, Filipe, Rebernak, William |
| Maintainer | CCSD |
| Last Updated | May 10, 2026, 05:59 (UTC) |
| Created | May 10, 2026, 05:59 (UTC) |
| Identifier | hal-00842566 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Chaire Conception Analogique Avancée Thales/Supélec ; Thales Communications [Colombes] ; THALES [France]-THALES [France]-Supélec Sciences des Systèmes (E3S) ; Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-Ecole Supérieure d'Electricité - SUPELEC (FRANCE) |
| coverage | New York, United States |
| creator | Dogaru, Emanuel |
| date | 2013-10-02T00:00:00 |
| harvest_object_id | d2be1d78-771d-41b5-86f6-b875ba6d5b8f |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2023-02-13T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/DFT.2013.6653595 |
| set_spec | type:COMM |