On-wafer multi-port circuits charaterization technique with a two-port VNA
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Proceedings of ARFTG_Spring, Microwave Measurement Conference |
| Author | Quintanel, Sébastien, Pasquet, Daniel, Bourdel, Emmanuelle, Duperrier, Cédric, Lesenechal, Dominique, Dinh, T. -V., Descamps, P. |
| Maintainer | CCSD |
| Last Updated | May 10, 2026, 18:58 (UTC) |
| Created | May 10, 2026, 18:58 (UTC) |
| Identifier | hal-00832506 |
| Language | en |
| contributor | ASTRE [Cergy-Pontoise] ; Equipes Traitement de l'Information et Systèmes (ETIS - UMR 8051) ; Ecole Nationale Supérieure de l'Electronique et de ses Applications (ENSEA)-Centre National de la Recherche Scientifique (CNRS)-CY Cergy Paris Université (CY)-Ecole Nationale Supérieure de l'Electronique et de ses Applications (ENSEA)-Centre National de la Recherche Scientifique (CNRS)-CY Cergy Paris Université (CY) |
| coverage | Seattle, United States |
| creator | Quintanel, Sébastien |
| date | 2013-06-07T00:00:00 |
| harvest_object_id | 9faa458e-6adc-4bcf-ba8b-a97cd821c1f4 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2025-03-09T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/ARFTG.2013.6579058 |
| set_spec | type:COMM |