Extrinsic base resistance optimization in DPSA-SEG SiGe:C HBTs
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Proceedings of 26th IEEE Bipolar/BiCMOS Circuits and Technology Meeting, BCTM 2012 |
| Author | Canderle, Elodie, Chevalier, Pascal, Montagne, A., Moynet, L., Avenier, Gregory, Boulenc, Pierre, Buczko, M., Carminati, Y., Rosa, J., Gaquière, Christophe, Chantre, Alain |
| Maintainer | CCSD |
| Last Updated | May 12, 2026, 15:25 (UTC) |
| Created | May 12, 2026, 15:25 (UTC) |
| Identifier | hal-00801192 |
| Language | en |
| contributor | Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN) ; Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF) |
| coverage | Portland, OR, United States |
| creator | Canderle, Elodie |
| date | 2012-09-30T00:00:00 |
| harvest_object_id | f5a27c26-a08a-4ab5-ab49-830b48fb6957 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2024-07-09T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/BCTM.2012.6352650 |
| set_spec | type:COMM |