Intrinsic degradation mechanism of nearly lattice-matched InAlN layers grown on GaN substrates
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0021-8979 |
| Author | Perillat-Merceroz, Guillaume, Cosendey, Gatien, Carlin, Jean-François, Butté, Raphaël, Grandjean, Nicolas |
| Maintainer | CCSD |
| Last Updated | May 14, 2026, 13:17 (UTC) |
| Created | May 14, 2026, 13:17 (UTC) |
| Identifier | hal-00787406 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Institute of Condensed Matter Physics [Lausanne] ; Ecole Polytechnique Fédérale de Lausanne (EPFL) |
| creator | Perillat-Merceroz, Guillaume |
| date | 2013-02-11T00:00:00 |
| harvest_object_id | 367d18ee-3baf-4664-898b-8166f589076d |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2024-11-18T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/arxiv/1302.3139 |
| set_spec | type:ART |