Towards Bayesian Network Methodology for Predicting the Equipment Health Factor of Complex Semiconductor Systems

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Source ISSN: 0020-7543
Author Bouaziz, Mohammed Farouk, Zamaï, Éric, Duvivier, F.
Maintainer CCSD
Last Updated May 14, 2026, 18:28 (UTC)
Created May 14, 2026, 18:28 (UTC)
Identifier hal-00783734
Language en
contributor Gestion et Conduite des Systèmes de Production (G-SCOP_GCSP) ; Laboratoire des sciences pour la conception, l'optimisation et la production (G-SCOP) ; Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS)
creator Bouaziz, Mohammed Farouk
date 2013-06-27T00:00:00
harvest_object_id bf80c8e3-12fc-4c7a-a2bf-9e18657ffa97
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2025-09-27T00:00:00
relation info:eu-repo/semantics/altIdentifier/doi/10.1080/00207543.2013.775525
set_spec type:ART