Characterization and VHDL-AMS modeling of SiC-JFET transistor
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 2103-3641 |
| Author | Mousa, Rami, Planson, Dominique, Morel, Hervé |
| Maintainer | CCSD |
| Last Updated | October 30, 2026, 05:29 (UTC) |
| Created | October 30, 2026, 05:29 (UTC) |
| Identifier | hal-00747438 |
| Language | en |
| contributor | Ampère (AMPERE) ; École Centrale de Lyon (ECL) ; Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL) ; Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon) ; Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS) |
| creator | Mousa, Rami |
| date | 2011-10-30T00:00:00 |
| harvest_object_id | 93e2ef51-3928-4042-9b35-25a91985098f |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-10-02T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.3166/EJEE.14.7-27 |
| set_spec | type:ART |