Low-cost and versatile thermal test chip for power assemblies assessment and thermometric calibration purposes
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 1359-4311 |
| Author | Jordà, X., Perpiñà, X., Vellvehi, M., Madrid, F., Flores, D., Hidalgo, S., Millán, J. |
| Maintainer | CCSD |
| Last Updated | October 31, 2026, 03:59 (UTC) |
| Created | October 31, 2026, 03:59 (UTC) |
| Identifier | hal-00741187 |
| Language | en |
| Rights | https://about.hal.science/hal-authorisation-v1/ |
| contributor | Instituto de Microelectrònica de Barcelona (IMB-CNM) ; Consejo Superior de Investigaciones Cientificas [España] = Spanish National Research Council [Spain] (CSIC)-Centro Nacional de Microelectronica [Spain] (CNM) |
| creator | Jordà, X. |
| date | 2011-04-12T00:00:00 |
| harvest_object_id | 21d7d13c-54a2-4342-9592-f0e84a77d024 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2024-05-14T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1016/j.applthermaleng.2011.02.008 |
| set_spec | type:ART |