Relation between diagnosis and diagnoses obtained from subsystems
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Proceedings of the 13th IFAC Symposium on Information Control Problems in Manufacturing (INCOM 2009) |
| Author | Hu, Hexuan, Gehin, Anne-Lise, Bayart, Mireille |
| Maintainer | CCSD |
| Last Updated | May 22, 2026, 14:29 (UTC) |
| Created | May 22, 2026, 14:29 (UTC) |
| Identifier | hal-00685564 |
| Language | en |
| contributor | Systèmes Tolérants aux Fautes (STF) ; Centre de Recherche en Informatique, Signal et Automatique de Lille - UMR 9189 (CRIStAL) ; Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS) |
| coverage | Moscow, Russia |
| creator | Hu, Hexuan |
| date | 2009-06-03T00:00:00 |
| harvest_object_id | ac4c6e3c-4c4c-4f0d-822a-47fc6be837a1 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2024-05-31T00:00:00 |
| set_spec | type:COMM |