On Proving the Efficiency of Alternative RF Tests
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | Proc. of IEEE/ACM International Conference on Computer-Aided Design (ICCAD'11) |
| Author | Kupp, N., Stratigopoulos, Haralampos-G, Drineas, P., Makris, Y. |
| Maintainer | CCSD |
| Last Updated | May 27, 2026, 17:21 (UTC) |
| Created | May 27, 2026, 17:21 (UTC) |
| Identifier | hal-00672537 |
| Language | en |
| contributor | Department of Electrical Engineering [Yale University] ; Yale University [New Haven] |
| coverage | San Jose, CA, United States |
| creator | Kupp, N. |
| date | 2011-11-07T00:00:00 |
| harvest_object_id | 8a39a588-1326-4d66-912c-23f177696e70 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-03-26T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/ICCAD.2011.6105415 |
| set_spec | type:COMM |