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RF Front-End Test Using Built-in Sensors
International audience -
On Proving the Efficiency of Alternative RF Tests
ISBN 978-1-4577-1399-6 -
Methodology for test metrics estimation built-in design flow of hard-to-simul...
The pervasiveness of the semiconductor industry in an increasing range of applications that span human activity stems from our ability to integrate more and more... -
A built-in I/sub IDDQ/ testing circuit
ISBN: 0-7803-9205-1 -
True Non-Intrusive Sensors for RF Built-In Test
International audience
