Improvement of the multilayer morphology (alumina/Cu/YIG/Cu) to characterize YIG thin film
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 1862-6300 |
| Author | Khalil, Ismail, Siblini, A., Chatelon, Jean-Pierre, Blanc-Mignon, M.-F., Rousseau, Jean-Jacques |
| Maintainer | CCSD |
| Last Updated | May 14, 2026, 11:41 (UTC) |
| Created | May 14, 2026, 11:41 (UTC) |
| Identifier | ujm-00788613 |
| Language | en |
| contributor | Laboratoire Telecom Claude Chappe (LT2C) ; Université Jean Monnet - Saint-Étienne (UJM) ; Université Jean Monnet (EPSCPE) (UJM EPE)-Université Jean Monnet (EPSCPE) (UJM EPE)-Ecole d'ingénieurs Télécom Saint-Etienne (TSE) |
| creator | Khalil, Ismail |
| date | 2011-05-14T00:00:00 |
| harvest_object_id | 0e5c609a-2a7c-4ce1-89f9-de8e9f677f7b |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-04-23T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1002/pssa.201026511 |
| set_spec | type:ART |