Physico-chemical characterization of multilayer YIG thin film deposited by rf sputtering
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 1286-0042 |
| Author | Abdel Samad, B., Blanc-Mignon, M.-F., Roumie, Mohamad, Siblini, A., Chatelon, Jean-Pierre, Korek, M. |
| Maintainer | CCSD |
| Last Updated | May 14, 2026, 11:41 (UTC) |
| Created | May 14, 2026, 11:41 (UTC) |
| Identifier | ujm-00788601 |
| Language | en |
| contributor | Dispositifs et Instrumentation en Optoélectronique et micro-ondes (DIOM) ; Université Jean Monnet - Saint-Étienne (UJM) ; Université Jean Monnet (EPSCPE) (UJM EPE)-Université Jean Monnet (EPSCPE) (UJM EPE) |
| creator | Abdel Samad, B. |
| date | 2010-05-14T00:00:00 |
| harvest_object_id | 9094d321-94cf-44e7-bd95-63f6483ef1f6 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-04-23T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1051/epjap/2010026 |
| set_spec | type:ART |