Radiation Effects in Pinned Photodiode CMOS Image Sensors: Pixel Performance Degradation Due to Total Ionizing Dose
Data and Resources
Additional Info
| Field | Value |
|---|---|
| Source | ISSN: 0018-9499 |
| Author | Goiffon, V., Estribeau, Magali, Marcelot, Olivier, Cervantes, P., Magnan, P., Gaillardin, M., Martin-Gonthier, P., Molina, R., Corbiere, F., Girard, Sylvain, Paillet, P., Marcandella, Claude |
| Maintainer | CCSD |
| Last Updated | May 29, 2026, 17:05 (UTC) |
| Created | May 29, 2026, 17:05 (UTC) |
| Identifier | ujm-00768295 |
| Language | en |
| contributor | Institut Supérieur de l'Aéronautique et de l'Espace (ISAE-SUPAERO) |
| creator | Goiffon, V. |
| date | 2012-12-11T00:00:00 |
| harvest_object_id | e702c26f-31d5-496e-a2cd-8f6ccd01b2d7 |
| harvest_source_id | 3374d638-d20b-4672-ba96-a23232d55657 |
| harvest_source_title | test moissonnage SELUNE |
| metadata_modified | 2026-04-23T00:00:00 |
| relation | info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2012.2222927 |
| set_spec | type:ART |