VLSI ("Very Large Scale Integration") technologies are part of our daily life and miniaturization needs are increasing. The densification of transistors not only means having trouble locating the so-called "hard defects" occurring during the development phases (debug) or aging, but also the appearance of pure non-functional behaviors related to component design flaws. Techniques discussed in this document are intended to probe microelectronic circuits using a tool called dynamic light emission (Time Resolved Imaging - TRI) in search of abnormal behavior in terms of timings and patterns involved in structures. To go further, this instrument also allows viewing thermographic time resolved thermal transients within a component.
