NOUVELLES METHODES D'IMAGERIE HAUTE RESOLUTION POUR L'ANALYSE DES COMPOSANTS NANOELECTRONIQUES

Laser Two-Photon Absorption (TPA) technique is studied in this work. Its use to detect default or inject faults in integrated circuits is discussed.

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Additional Info

Field Value
Source https://theses.hal.science/tel-00997436
Author Shao, Kai
Maintainer CCSD
Last Updated May 5, 2026, 10:04 (UTC)
Created May 5, 2026, 10:04 (UTC)
Identifier tel-00997436
Language fr
Rights https://about.hal.science/hal-authorisation-v1/
contributor Laboratoire de l'intégration, du matériau au système (IMS) ; Université de Bordeaux (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS)
creator Shao, Kai
date 2012-10-02T00:00:00
harvest_object_id 2d0bc1df-b11b-4090-8144-dc3338571d76
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2025-03-17T00:00:00
set_spec type:THESE