Development of Magnetic Microscopy techniques for failure localization on three-dimensional circuits

Magnetic Microscopy techniques are brought into play in this PhD to held the failure analysis of electronic components

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Additional Info

Field Value
Source https://theses.hal.science/tel-00997421
Author Infante, Fulvio
Maintainer CCSD
Last Updated May 5, 2026, 10:04 (UTC)
Created May 5, 2026, 10:04 (UTC)
Identifier tel-00997421
Language en
Rights https://about.hal.science/hal-authorisation-v1/
contributor Laboratoire de l'intégration, du matériau au système (IMS) ; Université de Bordeaux (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS)
creator Infante, Fulvio
date 2011-12-05T00:00:00
harvest_object_id 73e2fd3a-d3c5-4887-bfd0-965c1029c64e
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2025-03-17T00:00:00
set_spec type:THESE