CONTRIBUTION AU DEVELOPPEMENT DE TECHNIQUES DE STIMULATION LASER DYNAMIQUE POUR LA LOCALISATION DE DEFAUTS DANS LES CIRCUITS VLSI

Various Dynamic laser testing approaches are developed in this work. They aim to enhanced the range of defect localization inside VLSI chips.

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Additional Info

Field Value
Source https://theses.hal.science/tel-00997407
Author Amjad, Deyine
Maintainer CCSD
Last Updated May 5, 2026, 10:04 (UTC)
Created May 5, 2026, 10:04 (UTC)
Identifier tel-00997407
Language fr
Rights https://about.hal.science/hal-authorisation-v1/
contributor Laboratoire de l'intégration, du matériau au système (IMS) ; Université de Bordeaux (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS)
creator Amjad, Deyine
date 2011-04-13T00:00:00
harvest_object_id 7e28b456-d844-4315-8d47-5c901a885225
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2025-03-17T00:00:00
set_spec type:THESE