Modélisation de l'immunité des circuits intègres complexes aux perturbations électromagnétiques

The main objective of this thesis is the study of integrated circuits immunity against electromagnetic interference. The beginning is devoted to the presentation of the electromagnetic compatibility of integrated circuits. The tools enable the mastery of EMC are then presented. The main themes of modelling, optimization and measurement are exposed. The study continues by establishing a methodology for building a model of immunity applied to a converter circuit. This methodology is based on the proposed standard ICIM-CI to build successively the different blocks of the model of immunity. A particular attention is given to the description of the failure mechanism because it leads to the final results of immunity. The results from the model are then compared and validated by measurements on the circuit. Finally further studies on more complex circuits can suggest improvements and new perspectives for the modelling approach.

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Source https://theses.hal.science/tel-00991031
Author Gros, Jean-Baptiste
Maintainer CCSD
Last Updated May 5, 2026, 11:16 (UTC)
Created May 5, 2026, 11:16 (UTC)
Identifier tel-00991031
Language fr
Rights https://about.hal.science/hal-authorisation-v1/
contributor Laboratoire de l'intégration, du matériau au système (IMS) ; Université de Bordeaux (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS)
creator Gros, Jean-Baptiste
date 2010-12-03T00:00:00
harvest_object_id b23b412b-ea0d-47f9-a0ce-3ed8787a8e9a
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2025-03-17T00:00:00
set_spec type:THESE