CONTRIBUTION A L'IDENTIFICATION DE NOUVEAUX INDICATEURS DE DEFAILLANCE DES MODULES DE PUISSANCE A IGBT

Power electronics has a role increasingly growing up in transport: electric and hybrid vehicles, trains and aircraft. For these applications, security is a critical point, thus the reliability of the power assembly must be optimized. The knowledge of time to failure is very important information for the designers of these systems. In this context, an early failure indicator would predict system failures before it becomes effective. In this thesis, we focused on the electromechanical characterization of power transistors: MOSFET and IGBT. Based on these results this electromechanical characterization should help us in the longer term, to highlight an early failure indicator of the power assembly.

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Source https://theses.hal.science/tel-00988332
Author Belmehdi, Yassine
Maintainer CCSD
Last Updated May 5, 2026, 11:52 (UTC)
Created May 5, 2026, 11:52 (UTC)
Identifier tel-00988332
Language fr
Rights https://about.hal.science/hal-authorisation-v1/
contributor Laboratoire de l'intégration, du matériau au système (IMS) ; Université de Bordeaux (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS)
creator Belmehdi, Yassine
date 2011-05-04T00:00:00
harvest_object_id 51cedb2c-cf3c-42a0-bfcc-df1b0756255a
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2025-03-17T00:00:00
set_spec type:THESE