This thesis deals about depth resolved magnetic profile of ultrathin Fe layers studied by soft X-ray Resonant Magnetic Reflectivity (SXRMR). This SXRMR technique combines magneto-optic effects to X-ray scattering allowing to be sensitive to magnetic properties as well as to be depth resolved. For each experiments, the depth resolved magnetic profile found allows to study interfaces effect on the homogeneity of magnetic properties. First, we present the study of a thin film of Fe grown on a vicinal substrate of Ag(116) and covered by fifteen monolayers of Au. This study reveal that the magnetization is enhanced of 20 to 30% int the two to three monolayers near both interfaces, whatever the temperature and the Fe thickness are. We have also discover an inhomogeneity of the magnetic out of plane component at low temperature for sample where the magnetization easy axis is perpendicular to the steps : the magnetic out of plane component is more and more important when we go strait to the vicinal substrate of Ag. Second, we show the study of a thin film of six monolayers of Fe grown on a Cu(100) substrate and covered by a Au layer. Using a new way of strain on magnetic parameter we have highlighted that the temperature dependance of the magnetization is not the same depending ont the position of the monolayer inside the Fe thin film as predicted by the theory of Sandratski.
