Reliability and optimization of mechanical strucures in uncertain parameters : application to electronic cards

The main objective of this thesis is to study the electronics’ cards reliability. These cards are used in many fields, such as automotive, aerospace, telecommunications, medical. They provide all necessary electronic functions for well functioning of an electronic system. Electronic cards are undergoing various extreme stresses (mechanical, electrical, and thermal) when handling and commissioning. These stresses are due to drops, vibration and temperature variations. They may cause solder joints failures’ of electronic components. This may causes the failure of the entire electronic system. The objectives of this work are: To develop a numerical model to simulate the drop test of an electronic card; To predict the fatigue life of solder joints in uncertain environment of the variables; To develop a reliability-optimization method to determine the optimal geometry providing a targeted reliability level of an electronic card; To apply a new hybrid optimization method in order to determine the optimal geometry both of an electronic card and a solder joint.

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Source https://theses.hal.science/tel-00950354
Author Assif, Safa
Maintainer CCSD
Last Updated May 6, 2026, 07:06 (UTC)
Created May 6, 2026, 07:06 (UTC)
Identifier NNT: 2013ISAM0030
Language fr
Rights https://about.hal.science/hal-authorisation-v1/
contributor Laboratoire d'Optimisation et Fiabilité en Mécanique des Structures (LOFIMS) ; Institut national des sciences appliquées Rouen Normandie (INSA Rouen Normandie) ; Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)
creator Assif, Safa
date 2013-10-25T00:00:00
harvest_object_id 938d8471-47e1-4261-bcdb-e048c9bf623f
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2026-03-31T00:00:00
set_spec type:THESE