Nonlinear ionization inside dielectrics and semiconductors using long wavelength femtosecond laser

3D laser microfabrication inside narrow gap solids like silicon will require the use of long wavelength intense pulses. This experimental study concentrates on the specificity of the nonlinear ionization physics with tightly focused femtosecond laser beams over a wavelength range of 1300-2200 nm. The measured nonlinear absorption is independent of the wavelength in dielectrics revealing the increased importance of tunnel ionization with long wavelength. This can open up an alternative to pulse shortening toward ultraprecision optical breakdown in dielectrics. Using n-doped silicon, we study the multiphoton-avalanche absorption yields and thresholds inside semiconductors. Also observations of the irradiated materials reveal that the intrinsic properties of semiconductors prevent efficient direct energy deposition in the bulk for applications. This work illustrates opportunities for 3D laser micromachining in dielectrics and challenges for its extension to semiconductors.

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Source https://theses.hal.science/tel-00934983
Author Leyder, Stéphanie
Maintainer CCSD
Last Updated May 7, 2026, 07:20 (UTC)
Created May 7, 2026, 07:20 (UTC)
Identifier tel-00934983
Language fr
Rights https://about.hal.science/hal-authorisation-v1/
contributor Laboratoire Lasers, Plasmas et Procédés photoniques (LP3) ; Aix Marseille Université (AMU)-Centre National de la Recherche Scientifique (CNRS)
creator Leyder, Stéphanie
date 2013-12-17T00:00:00
harvest_object_id 30382362-76a2-4c42-9c02-5356c0dc8589
harvest_source_id 3374d638-d20b-4672-ba96-a23232d55657
harvest_source_title test moissonnage SELUNE
metadata_modified 2023-03-24T00:00:00
set_spec type:THESE